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NI PXI-6123 | Tested Surplus Unit 1-Year Warranty

Original price was: ¥999.00.Current price is: ¥888.00.

NI PXI-6123 | Tested Surplus Unit 1-Year Warranty

  • Exact Model: PXI-6123 (Part Number: 779180-01)
  • OEM Brand: National Instruments (NI)
  • System Series: S Series Simultaneous Sampling Multifunction DAQ Architecture
  • Core Function: Delivers dedicated Analog-to-Digital Converters (ADCs) per channel for high-speed, phase-aligned analog data acquisition, transient waveform analysis, and automated test cell measurement.
  • Module Type: 3U PXI Simultaneous Sampling Multifunction I/O Module
  • Defining Specs: 8 analog input channels, 500 kS/s per-channel simultaneous sampling rate, 16-bit ADC resolution, onboard memory buffers, 2 analog outputs, 8 digital I/O lines, 2 counter/timers.
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Description

NI PXI-6123 | Tested Surplus Unit 1-Year Warranty

 

Dynamic Product Introduction

A sampling skew error or ADC converter failure on a central data acquisition card skews phase-aligned acoustic, vibration, or transient voltage measurements, compromising automated test cell integrity and high-speed hardware-in-the-loop (HIL) simulations. The National Instruments PXI-6123 (P/N: 779180-01) is a high-performance 16-bit simultaneous sampling DAQ module designed for demanding test and measurement environments. Engineered with dedicated ADCs for each input channel, it captures up to 500 kS/s per channel concurrently, eliminating phase lag and inter-channel crosstalk across multi-axis sensor networks.

When an operational DAQ card develops FIFO buffer overflows, signal line driver faults, or calibration EEPROM corruptions mid-test sequence, obtaining a verified drop-in NI PXI-6123 replacement unit restores high-speed data acquisition immediately. Installing a fully bench-tested replacement module allows test engineers to slot the card directly into any standard PXI or PXI Hybrid chassis slot without modifying existing LabVIEW Virtual Instruments (VIs), DAQmx driver configurations, or front-panel SCSI/68-pin shielding cable harnesses. Swapping out a degraded module restores immediate phase-aligned sampling accuracy, reliable DMA bus data transfers, and total measurement confidence.

PXI-6123

PXI-6123

Key Technical Specifications

  • Model Designation: PXI-6123
  • Part Number: 779180-01
  • Manufacturer: National Instruments (NI)
  • Bus Interface: 3U PXI Hybrid Compatible (PXI Bus / PCI Backplane Interface)
  • Analog Input Channels: 8 differential simultaneous sampling channels
  • ADC Resolution: 16-bit dedicated architecture (1 ADC per input channel)
  • Maximum Sampling Rate: 500 kS/s simultaneous rate per channel (4 MS/s total system throughput)
  • Input Voltage Ranges: Software-selectable ±1.25 V, ±2.5 V, ±5 V, ±10 V
  • Analog Outputs: 2 voltage output channels (16-bit, up to 1 MS/s update rate)
  • Digital I/O & Timers: 8 DIO lines (5 V TTL/CMOS), 2 x 24-bit counter/timers
  • Onboard Memory: 16 MS or 32 MS deep onboard FIFO buffer (variant dependent)
  • Operating Temperature Range: 0°C to +55°C (32°F to 131°F)

 

Global Sourcing & Live-Test SOP (Transparency Core)

Procuring secondary-market test and measurement hardware like the NI PXI-6123 demands rigorous bench diagnostic screening to verify ADC linearity, phase synchronization across channels, and DMA bus streaming integrity. Every incoming DAQ module passes through an intensive five-stage quality assurance protocol:

  • Inbound Verification: Part numbers (779180-01), PCB revision stamps, and backplane pin connectors are cross-referenced with original National Instruments factory records. Technicians examine the front 68-pin VHDCI/SCSI connector, shielding, and PCB traces under magnification for physical wear or thermal stress.
  • Live Simulation: The PXI-6123 is installed in a calibrated PXI chassis connected to a host controller running NI-DAQmx diagnostics under 64-bit Windows environments.
  • Diagnostics: Technicians inject precision AC/DC signals from a calibrated multi-function calibrator across all 8 input channels simultaneously. Automated LabVIEW routines measure signal-to-noise ratio (SNR), total harmonic distortion (THD), inter-channel phase delay (<1 ns offset), and high-rate DMA streaming stability. The module undergoes a 24-hour thermal soak under full multi-channel acquisition loops inside an environmental test chamber.
  • Final Prep: Internal calibration EEPROM coefficients are verified, connector pins are treated with non-conductive electrical protectant, protective pin covers are fitted, and the board is sealed in static-shielding ESD packaging before dispatch.

 

The Field Engineer’s Pitfall Guide

  • ❗ Confounding Multiplexed vs. Simultaneous Sampling Architectures: —though you might expect standard NI M Series or X Series DAQ behavior, replacing a simultaneous sampling card with a multiplexed card (like a PXI-6251) introduces inter-channel phase delay, skewing time-domain calculations in transient vibration and acoustic phase analysis.
  • ❗ Failing to Account for Input Impedance Under Unpowered States: Connecting powered high-voltage transducers to the analog inputs while the PXI chassis is powered off can cause current backfeeding into the input multiplexers, damaging front-end buffer amplifiers. Always power up the PXI chassis before energizing external signal sources.
  • ❗ Using Unshielded Terminal Blocks and Cabling: Running high-frequency analog signals through non-shielded ribbon cables or unshielded breakout boxes (like non-E Series blocks) degrades 16-bit resolution, introducing environmental EMI noise and crosstalk onto sensitive measurement channels.

 

Intent-Driven FAQ

What is the primary difference between the NI PXI-6123 and multiplexed DAQ cards?

The features an independent Analog-to-Digital Converter (ADC) for each of its 8 input channels, allowing simultaneous signal capture at 500 kS/s per channel without the phase delay inherent in single-ADC multiplexed architectures.

Which software drivers support the NI PXI-6123 in modern operating systems?

The is fully supported by standard NI-DAQmx driver software, making it seamlessly compatible with LabVIEW, LabWindows/CVI, C/C++, Python, and MATLAB environments.

What causes a “FIFO Buffer Overflow” error during high-speed acquisition?

A FIFO buffer overflow occurs when the host PXI system fails to pull data off the module’s onboard RAM fast enough, usually caused by bus latency, background CPU load, or improper DMA buffer allocation in the host application software.

Is the PXI-6123 compatible with modern PXI Express (PXIe) hybrid chassis slots?

Yes. The is designed with a PXI Hybrid backplane connector, allowing it to be installed into both legacy PXI peripheral slots and modern PXIe Hybrid peripheral slots.

What warranty coverage comes with pre-inspected replacement DAQ cards?

All verified National Instruments PXI-6123 modules come backed by a comprehensive 1-year replacement warranty. If the unit experiences ADC failure, channel drift, or bus communication drops under standard operating conditions within 12 months, it is swapped directly from available warehouse inventory stock.

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