Advantest BGR-022365-A000824B-DED Test & Measurement Module Overview

Brand Background

Advantest Corporation is a global market leader in automated test equipment (ATE) for the semiconductor industry. Known for high-precision measurement systems, Advantest designs and manufactures advanced test solutions used in research and development, device characterization, and high-volume semiconductor manufacturing worldwide.

BGR-022365-A000824B-DED

Model Overview: BGR-022365-A000824B-DED

The Advantest BGR-022365-A000824B-DED (often referenced as part number BGR-022365 or model A000824B-DED) is a specialized channel/power power supply (PPS) pin driver and test card module engineered for Advantest automated semiconductor test platforms.

This high-density module provides multi-channel signal driver and measurement functionality, ensuring accurate power supply, parametric measurement, and functional signal testing for integrated circuits (ICs) during wafer sorting and final package testing.

Key Technical Specifications and Parameters

• Manufacturer: Advantest Corporation

• Part / Model Number: BGR-022365-A000824B-DED (Model A000824B-DED / Part BGR-022365)

• Product Type: Programmable Power Supply (PPS) / Multi-Channel Test Module

• Channel Architecture: 16-channel / multi-channel driver board configuration

• Current Rating: Up to 0.8A per channel capability

• Signal Support: Analog, digital, and mixed-signal pin driving/testing

• Form Factor: Modular rack-mountable plug-in card for ATE chassis integration

• Calibration & Control: Automated self-calibration with high precision and low noise signal conditioning

Operating Industries

The BGR-022365-A000824B-DED module is specifically built for industries requiring rigorous electronic device validation and semiconductor fabrication testing:

• Semiconductor Manufacturing: Integrated circuit (IC) fabrication plants, wafer testing facilities, and OSAT (Outsourced Semiconductor Assembly and Test) providers.

• Electronics Manufacturing Services (EMS): Production lines verifying high-volume electronic component reliability.

• Automotive & Aerospace Microelectronics: Quality assurance testing for mission-critical microchips and automotive controllers.

• Research & Development Laboratories: Microelectronics R&D institutes conducting device characterization and prototype testing.

Common Usage Scenarios

1. Automated Wafer Probing & Final Testing

   Serving as a core pin driver unit in ATE test heads to deliver precisely regulated voltages and currents to silicon wafers or packaged IC chips.

2. Parametric and Functional Validation

   Measuring DC parameters, leakage currents, and dynamic response profiles across multi-pin digital, analog, or mixed-signal semiconductor devices.

3. High-Volume Production Screening

   Executing rapid, high-throughput pass/fail functional testing in semiconductor back-end assembly facilities to enforce strict quality control standards.